Paper
19 February 2004 Photodetector with giant internal current amplification: experiment and numerically calculated model
Aleksandr Malik, Volodymyr Grimalsky, Alfonso Jacome Torres, Carlos Zuniga, D. Durini
Author Affiliations +
Abstract
New silicon based optical sensors with a metal - insulator - semiconductor structure (MIS) are developed and investigated both theoretically and experimentally. The physical properties of these sensors are described with a model of MIS capacitor where a presence of depletion layer of electrons and an inversion layer of holes of a finite depth is taken into account. Two-level voltage bias provides a transient between two quasi-equilibrium inversion modes. This transient is applied both for storage and for readout of the input optical signal for quantitative measurements of a weak infra red radiation. Proposed simple readout procedure provides reading the integrated information with a significant amplification. The amplification (or the current transformation coefficient) is determined by the ratio of integration and readout times and it may exceed 104. A theoretical model is given to explain a behavior of the sensor under storage by thermo generated carries and by photo generated ones jointly. Numerical simulations are of an agreement with experimental investigations of proposed sensors.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Aleksandr Malik, Volodymyr Grimalsky, Alfonso Jacome Torres, Carlos Zuniga, and D. Durini "Photodetector with giant internal current amplification: experiment and numerically calculated model", Proc. SPIE 5251, Detectors and Associated Signal Processing, (19 February 2004); https://doi.org/10.1117/12.512861
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Silicon

Sensors

Capacitors

Dielectrics

Interfaces

Electrons

Semiconductors

RELATED CONTENT

Surface plasmon photodetectors
Proceedings of SPIE (May 06 2013)
Modeling field effect pH sensor
Proceedings of SPIE (December 29 2004)

Back to Top