Stitching interferometry: recent results and absolute calibration

Michael Bray

doi:10.1117/12.516164

26 February 2004 Stitching interferometry: recent results and absolute calibration

Michael Bray

Proceedings Volume 5252, Optical Fabrication, Testing, and Metrology; (2004) https://doi.org/10.1117/12.516164
Event: Optical Systems Design, 2003, St. Etienne, France

Abstract

Stitching Interferometry is a method of analysing large optical components using a standard "small" interferometer. This result is obtained by taking multiple overlapping images of the large component, and numerically "stitching" these sub-apertures together. We have already reported the industrial use our Stitching Interferometry systems (Previous SPIE symposia), but experimental results had been lacking because this technique is still new, and users needed to get accustomed to it before producing reliable measurements. We now have more results. We will report user comments and show new, unpublished results. We will discuss sources of error, and show how some of these can be reduced to arbitrarily small values. These will be discussed in some detail. We conclude with a few graphical examples of absolute measurements performed by us.

Citation Download Citation

Michael Bray "Stitching interferometry: recent results and absolute calibration", Proc. SPIE 5252, Optical Fabrication, Testing, and Metrology, (26 February 2004); https://doi.org/10.1117/12.516164

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