Paper
22 June 2004 Characterization of commercial-type vibration exciters by self-mixing interferometry
Enver Sadikoglu, Eyup Bilgic, Baki Karaboce
Author Affiliations +
Proceedings Volume 5503, Sixth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications; (2004) https://doi.org/10.1117/12.579620
Event: Sixth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, 2004, Ancona, Italy
Abstract
Electrodynamic vibration exciters are widely used for different purposes. One of their important applications is usage as a vibration generating chain in absolute calibrations of vibration pick-ups. Main requirements for the vibration-generating devices are described in relevant ISO standard. These requirements are the total harmonic distortion of the acceleration, transverse, bending and rocking motion, hum and noise level, and the acceleration amplitude stability. The bending, rocking and transverse accelerations are the properties that belonging entirely to the vibration exciter. Contribution of these effects to the overall calibration uncertainty is not as small as to be assumed negligible. Investigation of the motional behavior of some of the commercial electrodynamic exciters by self-mixing interferometry has been carried out at Turkish National Metrology Institute (UME). Interferometer in configuration of the external cavity diodes laser (ECDL) constructed at UME was used for the characterization of the exciters' surface displacement in the medium frequency range.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Enver Sadikoglu, Eyup Bilgic, and Baki Karaboce "Characterization of commercial-type vibration exciters by self-mixing interferometry", Proc. SPIE 5503, Sixth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, (22 June 2004); https://doi.org/10.1117/12.579620
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KEYWORDS
Interferometers

Calibration

Interferometry

Semiconductor lasers

Electrodynamics

Metrology

Mirrors

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