Paper
19 October 2006 Electrical properties of single-walled carbon nanotube films
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Abstract
We first demonstrate efficient patterning of conductive and transparent single-walled carbon nanotube films by photo- and e-beam lithography and subsequent reactive ion etching in an ICP-RIE system. We then study the geometry dependent transport characteristics of the film patterned into four point probe structures. We find that resistivity is independent of film length, while increasing significantly when width and thickness of the film shrink. We explain this behavior by a geometrical argument. The ability to pattern the film could enable the integration of nanotube films into electronic devices; however, the strong resistivity scaling should be carefully taken into account when designing submicron devices.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ant Ural "Electrical properties of single-walled carbon nanotube films", Proc. SPIE 6370, Nanomaterial Synthesis and Integration for Sensors, Electronics, Photonics, and Electro-Optics, 63700F (19 October 2006); https://doi.org/10.1117/12.690794
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KEYWORDS
Single walled carbon nanotubes

Electron beam lithography

Etching

Polymethylmethacrylate

Optical lithography

Transparent conducting films

Reactive ion etching

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