Real-time dual-wavelength digital holographic microscopy for extended measurement range with enhanced axial resolution

Jonas Kühn; Tristan Colomb; Christophe Pache; Florian Charrière; Frédéric Montfort; Etienne Cuche; Yves Emery; Pierre Marquet; Christian Depeursinge

doi:10.1117/12.763291

20 February 2008 Real-time dual-wavelength digital holographic microscopy for extended measurement range with enhanced axial resolution

Jonas Kühn, Tristan Colomb, Christophe Pache, Florian Charrière, Frédéric Montfort, Etienne Cuche, Yves Emery, Pierre Marquet, Christian Depeursinge

Author Affiliations +

Proceedings Volume 6861, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV; 68610J (2008) https://doi.org/10.1117/12.763291
Event: SPIE BiOS, 2008, San Jose, California, United States

Abstract

We report on advanced dual-wavelength digital holographic microscopy (DHM) methods, enabling single-acquisition real-time micron-range measurements while maintaining single-wavelength interferometric resolution in the nanometer regime. In top of the unique real-time capability of our technique, it is shown that axial resolution can be further increased compared to single-wavelength operation thanks to the uncorrelated nature of both recorded wavefronts. It is experimentally demonstrated that DHM topographic investigation within 3 decades measurement range can be achieved with our arrangement, opening new applications possibilities for this interferometric technique.

Citation Download Citation

Jonas Kühn, Tristan Colomb, Christophe Pache, Florian Charrière, Frédéric Montfort, Etienne Cuche, Yves Emery, Pierre Marquet, and Christian Depeursinge "Real-time dual-wavelength digital holographic microscopy for extended measurement range with enhanced axial resolution", Proc. SPIE 6861, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV, 68610J (20 February 2008); https://doi.org/10.1117/12.763291

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