A reconstruction method for linear sensor microscopy based on improvement of lateral resolution isotropy

M. P. Macedo; C.M.B.A. Correia

doi:10.1117/12.889962

8 June 2011 A reconstruction method for linear sensor microscopy based on improvement of lateral resolution isotropy

M. P. Macedo, C.M.B.A. Correia

Proceedings Volume 8086, Advanced Microscopy Techniques II; 80861J (2011) https://doi.org/10.1117/12.889962
Event: European Conferences on Biomedical Optics, 2011, Munich, Germany

Abstract

The aim of this work is to obtain improved sectioning ability in our slit-scanning microscope. The experimental setup is based on a linear sensor and different illumination modes were evaluated. MTF measurements from USAF target images showed the great benefit of using slit illumination in comparison to widefield. Experimental determination of Strehl ratios of 0.62 and 0.96 for wide-field and slit-illumination configurations, respectively, is depicted. Also MTF degradation with defocus is fairly established as stated by Strehl ratio decrease from 0.68 to 0.59 in 2 μm defocus using widefield configuration. Experimental measurement of axial response showed good accordance to numerically simulated curves modeled for the same parameters as the experimental setup. Linear sensor microscopy shows its advantage in comparison to simple slit microscopy particularly for slit illumination. Imaging for details running in sensor direction is accomplished for parallel illumination and detection slits as well as effective axial response for right-angled slits. These results indicate that linear sensor microscopy should be able to surpass lateral resolution asymmetry of slit microscopy. Preliminary results from tests to develop a reconstruction method that combine algorithms to improve lateral resolution isotropy of 2D images and those to build 3D images will be presented.

Citation Download Citation

M. P. Macedo and C.M.B.A. Correia "A reconstruction method for linear sensor microscopy based on improvement of lateral resolution isotropy", Proc. SPIE 8086, Advanced Microscopy Techniques II, 80861J (8 June 2011); https://doi.org/10.1117/12.889962

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