Automatic Computer Analysis Of Double Exposure Hologram In Industrial Nondestructive Control

F. Lamy; C. Liegeois; P. Meyrueis

doi:10.1117/12.933954

7 July 1983 Automatic Computer Analysis Of Double Exposure Hologram In Industrial Nondestructive Control

F. Lamy, C. Liegeois, P. Meyrueis

Proceedings Volume 0353, Industrial and Commercial Applications of Holography; (1983) https://doi.org/10.1117/12.933954
Event: 26th Annual Technical Symposium, 1982, San Diego, United States

Abstract

A software package based on symbolic form recognition algorithms has been established for holographic fringe characterization through a video camera. This program also includes sections for separating the inner defects from the outer ones in periodic structures. It has been tested successfully on cylindrical containers made of wired keolar on which all other non-holographic testing methods are inapplicable.

Citation Download Citation

F. Lamy, C. Liegeois, and P. Meyrueis "Automatic Computer Analysis Of Double Exposure Hologram In Industrial Nondestructive Control", Proc. SPIE 0353, Industrial and Commercial Applications of Holography, (7 July 1983); https://doi.org/10.1117/12.933954

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available