Ultrafast phenomena at the nanoscale: novel science opportunities at the SwissFEL X-ray Laser

B. D. Patterson; R. Abela; H.-H. Braun; R. Ganter; B. Pedrini; M. Pedrozzi; S. Reiche; M. van Daalen

doi:10.1117/12.2011126

11 December 2012 Ultrafast phenomena at the nanoscale: novel science opportunities at the SwissFEL X-ray Laser

B. D. Patterson, R. Abela, H.-H. Braun, R. Ganter, B. Pedrini, M. Pedrozzi, S. Reiche, M. van Daalen

Proceedings Volume 8678, Short-Wavelength Imaging and Spectroscopy Sources; 867802 (2012) https://doi.org/10.1117/12.2011126
Event: Short-Wavelength Imaging and Spectroscopy, 2012, Bern, Switzerland

Abstract

Next-generation X-ray sources, based on the X-ray Free Electron Laser (XFEL) concept, will provide highly coherent, ultrashort pulses of soft and hard X-rays with peak intensity many orders of magnitude above that of a synchrotron. These pulses will allow studies of femtosecond dynamics at nanometer resolution and with chemical selectivity. They will produce coherent-diffraction images of organic and inorganic nanostructures without the deleterious effects of radiation damage.

Citation Download Citation

B. D. Patterson, R. Abela, H.-H. Braun, R. Ganter, B. Pedrini, M. Pedrozzi, S. Reiche, and M. van Daalen "Ultrafast phenomena at the nanoscale: novel science opportunities at the SwissFEL X-ray Laser", Proc. SPIE 8678, Short-Wavelength Imaging and Spectroscopy Sources, 867802 (11 December 2012); https://doi.org/10.1117/12.2011126

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