Axis consistency testing method based on image processing technology for non-cooperative target

Xin Li; Yong Zhang; Dongxi Ma

doi:10.1117/12.2243251

27 September 2016 Axis consistency testing method based on image processing technology for non-cooperative target

Xin Li, Yong Zhang, Dongxi Ma

Proceedings Volume 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment; 96842X (2016) https://doi.org/10.1117/12.2243251
Event: Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016), 2016, Suzhou, China

Abstract

The multi-axis consistency among optical sensors is the basic guarantee to ensure the normal operation of the entire optical equipment. In the paper the new method which is image processing technology for non-cooperative target is provided to solve the axis consistency testing question. In detail, firstly an observing object is chosen as non-cooperative target in scene in front of inspected equipment. Secondly the target is observed by the optical sensor and the central location of crosshair in image is recorded. Thirdly the same target is observed again using another optical sensor and the central location of crosshair in image is record. At last, the testing result of two optical sensors can be obtained by the position deviation of crosshair central comparing two images. The axis consistency of mechanical axis and the optical axis is detected by the CCD imaging systems, which held on the mechanical axis of the measured object. Not only the proposed method is suitable to different working band, but also it is very small, not limited by field condition and convenient for carry. Furthermore experimental results show the proposed method has high inspecting accuracy, which explain the feasibility and potential applications.

Citation Download Citation

Xin Li, Yong Zhang, and Dongxi Ma "Axis consistency testing method based on image processing technology for non-cooperative target", Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96842X (27 September 2016); https://doi.org/10.1117/12.2243251

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KEYWORDS

Image processing

Reticles

Optical sensors

Infrared radiation

Target detection

Visible radiation

Image sensors

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