Xin Li
at Shijiazhuang Mechanical Technology Institute
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 September 2016 Paper
Xin Li, Yong Zhang, Dongxi Ma
Proceedings Volume 9684, 96842X (2016) https://doi.org/10.1117/12.2243251
KEYWORDS: Image processing, Testing and analysis, Reticles, Optical sensors, Visible radiation, Infrared radiation, Target detection, Image sensors, Imaging systems, Inspection

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