Dawei Yin
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 January 2010 Paper
Dawei Yin, Henry Baird, Chang An
Proceedings Volume 7534, 753409 (2010) https://doi.org/10.1117/12.838957
KEYWORDS: Statistical analysis, Feature extraction, Detection and tracking algorithms, Algorithm development, Lithium, Astatine, Error analysis, Image processing, Data modeling, Computer science

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