Dr. Jinsuk Yim
Director of Technology at Samsung C&T
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 April 2009 Paper
Jinsuk Yim, Yinghong Cao, Ming Wang
Proceedings Volume 7294, 72940P (2009) https://doi.org/10.1117/12.815810
KEYWORDS: Bridges, Sensors, Structural health monitoring, Temperature metrology, Epoxies, Transducers, Polymers, Safety, Damage detection, Resistance

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