Dr. Juan Liu
at PARC, part of SRI International
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 November 2003 Paper
Proceedings Volume 5207, (2003) https://doi.org/10.1117/12.508038
KEYWORDS: Wavelets, Statistical analysis, Signal processing, Interference (communication), Signal attenuation, Image denoising, Image processing, Statistical modeling, Denoising, Electronic filtering

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