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Prof. L. Scott Chumbley
at Iowa State Univ of Science and Technology
SPIE Involvement:
Author
Publications (2)
Proceedings Article | 13 September 2012 Paper
3D data processing with advanced computer graphics tools
Song Zhang, Laura Ekstrand, Taylor Grieve, David Eisenmann, L. Scott Chumbley
Proceedings Volume 8493, 849310 (2012) https://doi.org/10.1117/12.930376
KEYWORDS: Computer graphics, Profilometers, Image resolution, Data processing, Denoising, Error analysis, 3D image processing, 3D displays, Optical spheres, 3D scanning
Proceedings Article | 22 May 2009 Paper
Use of a scanning optical profilometer for toolmark characterization
L. S. Chumbley, D. J. Eisenmann, M. Morris, S. Zhang, J. Craft, C. Fisher, A. Saxton
Proceedings Volume 7378, 73782D (2009) https://doi.org/10.1117/12.825185
KEYWORDS: Profilometers, Forensic science, Manufacturing, Statistical analysis, Surface roughness, 3D scanning, Lead, Radium, Standards development, Data processing
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