Dr. Paulius Sakalas Profile

Dr. Paulius Sakalas

at TU Dresden

SPIE Involvement:

Author

Publications (3)

Proceedings Article | 11 June 2007 Paper

Microscopic modeling of impact-ionization noise in SiGe heterojunction bipolar transistors

Mindaugas Ramonas, Christoph Jungemann, Paulius Sakalas, Michael Schröter, Wolfgang Kraus

Proceedings Volume 6600, 66001F (2007) https://doi.org/10.1117/12.724631

KEYWORDS: Transistors, Monte Carlo methods, Ionization, Calibration, Solids, Heterojunctions, Data modeling, Silicon, Doping, Device simulation

Read Abstract +

Proceedings Article | 25 May 2004 Paper

Microwave noise in III-V and SiGe based HBTs, comparison, trends, numbers

Paulius Sakalas, Michael Schroter

Proceedings Volume 5470, (2004) https://doi.org/10.1117/12.546899

KEYWORDS: Data modeling, Resistance, Indium gallium phosphide, Microwave radiation, Transistors, Scattering, Diffusion, Device simulation, Advanced distributed simulations, Radon

Read Abstract +

Proceedings Article | 12 May 2003 Paper

Shot noise reduction in the AlGaAs/GaAs- and InGaP/GaAs-based HBTs

Paulius Sakalas, Michael Schroeter, Peter Zampardi, Herbert Zirath

Proceedings Volume 5113, (2003) https://doi.org/10.1117/12.490187

KEYWORDS: Indium gallium phosphide, Electrons, Gallium arsenide, Denoising, Microwave radiation, Resistance, Data modeling, Scattering, Radon, Aluminum

Read Abstract +

Conference Committee Involvement (2)

Noise and Information in Nanoelectronics, Sensors, and Standards II

26 May 2004 | Maspalomas, Gran Canaria Island, Spain

Noise and Information in Nanoelectronics, Sensors, and Standards

2 June 2003 | Santa Fe, New Mexico, United States

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years