Mr. Philippe Oberson Profile

Philippe Oberson

Research Scientist at EXFO

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Proceedings Article | 20 December 2004 Paper

Refractive-index measurement of high-refractive-index integrated-optic components

Philippe Oberson

Proceedings Volume 5577, (2004) https://doi.org/10.1117/12.568332

KEYWORDS: Waveguides, Sensors, Calibration, Objectives, Refractive index, Polarization, Optical fibers, Integrated optics, Polishing, Interfaces

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The most commonly-used technique for measuring the refractive index profile of an optical fiber is the refracted near-field method. This standard method cannot be directly used for integrated optical waveguides such as silica-on-silicon or LiNbO₃ because of the geometrical constraints imposed by the slab waveguide. A modified method was described in previous work and subsequently implemented with some improvements (e.g. use of a calibrated solid refractive-index reference element; a simplified waveguide identification) in a commercial apparatus. However, the non-availability of suitable index-matching liquids having an index of refraction greater than about 1.8 prevent this apparatus being used with high-index DUTs. In this paper, we propose and experimentally verify a modified instrument that permits the characterization of the index profile of high refractive-index waveguides such as LiNbO₃. Provided that the waveguide is written in a homogeneous bulk substrate with a known index, this modified approach allows for spatial and refractive-index resolutions that are practically as good as those obtained with the standard technique applied to optical fibers.

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