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Rwik Sengupta
at Cadence Design Systems Inc
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Publications (1)
Proceedings Article | 22 February 2021 Poster + Paper
Fast, high-capacity critical area analysis (CAA) with advanced FINFET defectivity calculation
Xiaoyuan Qi, Atul Chittora, Aaron Sinnott, Binod Kumar G. Nair, Shobhit Malik, Jeffrey Nelson, Jac Condella, Jonathan Fales, Rwik Sengupta, Ya-Chieh Lai, Frank Gennari, Philippe Hurat
Proceedings Volume 11614, 1161413 (2021) https://doi.org/10.1117/12.2583515
KEYWORDS: Fin field effect transistors, Transistors, Semiconductors, High volume manufacturing, Databases, Data modeling
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