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Shahzad A. Qureshi
at Indian Institute of Technology Kanpur
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Publications (1)
Proceedings Article | 15 October 2012 Paper
Impact of Ge Profile on The Performance of PNP SiGe HBT on Thin Film SOI
Prasanna Misra, S. Qureshi
Proceedings Volume 8549, 854908 (2012) https://doi.org/10.1117/12.926345
KEYWORDS: Germanium, Thin films, Fourier transforms, Device simulation, Neodymium, Numerical simulations, Resistance, Signal analysis, Capacitance, Analog electronics
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