Sunil Srinivasan
Sales Representative at Oerlikon USA Inc
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 20 October 2006 Paper
Proceedings Volume 6349, 63490A (2006) https://doi.org/10.1117/12.686390
KEYWORDS: Etching, Photomasks, Chromium, Binary data, Critical dimension metrology, Plasma, Control systems, Ions, Lithography

Proceedings Article | 28 June 2005 Paper
Proceedings Volume 5853, (2005) https://doi.org/10.1117/12.617095
KEYWORDS: Etching, Quartz, Photomasks, Phase shifts, Chromium, Chemistry, Dry etching, Plasma, Scanning electron microscopy, Photoresist processing

Proceedings Article | 22 January 2005 Paper
Proceedings Volume 5715, (2005) https://doi.org/10.1117/12.582764
KEYWORDS: Etching, Silicon, Microelectromechanical systems, Time division multiplexing, Plasma, Semiconducting wafers, Multiplexing, High aspect ratio silicon micromachining, Oxides, Ions

Proceedings Article | 6 December 2004 Paper
Proceedings Volume 5567, (2004) https://doi.org/10.1117/12.571468
KEYWORDS: Etching, Photomasks, Quartz, Scanning electron microscopy, Reactive ion etching, Phase shifts, Dry etching, Lithography, Manufacturing, Surface roughness

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