Dr. Taeho Ha
at Korea Institute of Machinery & Materials
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 17 November 2008 Paper
Chang-Woo Lee, Jun-Yeob Song, Tae-Ho Ha
Proceedings Volume 7266, 72661M (2008) https://doi.org/10.1117/12.807264
KEYWORDS: Calibration, CCD cameras, Pixel resolution, Interferometers, Laser systems engineering, Machine vision, Standards development, Error analysis, Image resolution, Manufacturing

Proceedings Article | 25 October 2004 Paper
Taeho Ha, Yasuhiro Takaya, Takashi Miyoshi, Shingo Ishizuka, Tatsuhiko Suzuki
Proceedings Volume 5603, (2004) https://doi.org/10.1117/12.571001
KEYWORDS: Calibration, 3D metrology, Fringe analysis, Optical spheres, CCD image sensors, LCDs, Data modeling, Projection systems, Image sensors, Cameras

Proceedings Article | 8 October 2004 Paper
Gohki Oda, Takashi Miyoshi, Yasuhiro Takaya, Taeho Ha, Keiichi Kimura
Proceedings Volume 5662, (2004) https://doi.org/10.1117/12.596758
KEYWORDS: LCDs, Microfabrication, Stereolithography, Liquids, Light sources, 3D displays, Solids, Rapid manufacturing, Computer aided design, Optical lithography

Proceedings Volume Editor (2)

SPIE Conference Volume | 5 December 2005

Conference Committee Involvement (2)
Optomechatronic Sensors and Instrumentation II
3 October 2006 | Boston, Massachusetts, United States
Optomechatronic Sensors and Instrumentation
5 December 2005 | Sapporo, Japan
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