Dr. Todd A. Pitts
at Sandia National Labs
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 28 October 2022 Presentation + Paper
Proceedings Volume 12276, 122760D (2022) https://doi.org/10.1117/12.2643193
KEYWORDS: Algorithm development, Data storage, Data modeling, Detection and tracking algorithms, Computing systems, Machine learning, Data acquisition, Artificial intelligence

Proceedings Article | 19 May 2006 Paper
Robert Nellums, Robert Habbit, Mark Heying, Todd Pitts, John Sandusky
Proceedings Volume 6220, 62200G (2006) https://doi.org/10.1117/12.670569
KEYWORDS: Sensors, Inspection, Video, Image processing, Video processing, 3D image processing, Photography, Cameras, Space operations, Control systems

Proceedings Article | 22 August 2001 Paper
Proceedings Volume 4344, (2001) https://doi.org/10.1117/12.436769
KEYWORDS: Scatterometry, Scatter measurement, Semiconducting wafers, Light scattering, Diffraction, Diffraction gratings, Photoresist materials, Atomic force microscopy, Metrology, Polarization

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