Dr. Xuepeng Gong
at CIOMP
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 March 2015 Paper
Xuepeng Gong, Qipeng Lu, Guoqing Lu
Proceedings Volume 9446, 94460W (2015) https://doi.org/10.1117/12.2180670
KEYWORDS: Carbon, Extreme ultraviolet, Mirrors, Contamination, Extreme ultraviolet lithography, EUV optics, Instrument modeling, Molecules, Spherical lenses, Data modeling

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