Yeliang Zheng
at Electronic Engineering Institute
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 November 2016 Paper
Yeliang Zheng, Yihua Hu, Baokun Huang
Proceedings Volume 10141, 1014115 (2016) https://doi.org/10.1117/12.2253801
KEYWORDS: Temperature metrology, Rayleigh scattering, Scattering, Sensors, Light scattering, Laser scattering, Molecules, Error analysis, Mie scattering, Heterodyning

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