Hao Yun Yu
at National Taiwan Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 2 April 2014 Paper
Proceedings Volume 9050, 905032 (2014) https://doi.org/10.1117/12.2048683
KEYWORDS: Calibration, Lithography, Scatterometry, Semiconducting wafers, Light scattering, 3D modeling, Diffraction, Scattering, Photoresist processing, Process control

Proceedings Article | 28 March 2014 Paper
Proceedings Volume 9049, 90492C (2014) https://doi.org/10.1117/12.2046615
KEYWORDS: Line edge roughness, Critical dimension metrology, Electron beam lithography, Lithography, Optical lithography, Transistors, Electrons, Semiconducting wafers, Tolerancing, Directed self assembly

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