Paper
14 August 1997 Deep ion-beam lithography for micromachining applications
Stuart Victor Springham, Thomas Osipowicz, J. L. Sanchez, Sing Lee, Frank Watt
Author Affiliations +
Proceedings Volume 3183, Microlithographic Techniques in IC Fabrication; (1997) https://doi.org/10.1117/12.280533
Event: ISMA '97 International Symposium on Microelectronics and Assembly, 1997, Singapore, Singapore
Abstract
LIGA and its defining process deep x-ray lithography, is an important method for machining high-aspect ratio microstructures, and a diverse range of applications are presently being investigated. One limitation of the technique is associated with the restriction on the 3D shape of the machined structures to essentially prismatic geometry. Further technical problems concerning the fabrication of a suitable mask for deep x-ray lithography are associated with the limited thickness of resist which can be patterned using electron beam lithography, and the undesirable exposure of resist by secondary radiations in an intervening x-ray lithography step which is used to produce a thicker mask. A deep lithography process using a focused beam of high energy light ions has the potential to overcome many of the geometrical restrictions inherent in deep x-ray lithography. An alternative use of deep ion bema lithography is to pattern a thick resist layer for the production of masks for deep x-ray lithography. This paper reports progress on the development of a system for deep ion bema lithography using a scanned 2.0 MeV proton beam of approximately 1 micron diameter. The result of computer simulations of the capabilities of deep ion beam lithography for the fabrication of thick DXL masks is presented.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stuart Victor Springham, Thomas Osipowicz, J. L. Sanchez, Sing Lee, and Frank Watt "Deep ion-beam lithography for micromachining applications", Proc. SPIE 3183, Microlithographic Techniques in IC Fabrication, (14 August 1997); https://doi.org/10.1117/12.280533
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Cited by 5 scholarly publications.
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KEYWORDS
Lithography

X-ray lithography

Photomasks

Ion beam lithography

Ion beams

Ions

Micromachining

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