PROCEEDINGS VOLUME 7309
SPIE DEFENSE, SECURITY, AND SENSING | 13-17 APRIL 2009
Passive Millimeter-Wave Imaging Technology XII
Editor Affiliations +
IN THIS VOLUME

5 Sessions, 22 Papers, 0 Presentations, 0 Posters
Systems  (4)
Security  (8)
Proceedings Volume 7309 is from: Logo
SPIE DEFENSE, SECURITY, AND SENSING
13-17 April 2009
Orlando, Florida, United States
Front Matter: Volume 7309
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 730901 (2009) https://doi.org/10.1117/12.831956
Phenomenology
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 730902 (2009) https://doi.org/10.1117/12.819033
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 730903 (2009) https://doi.org/10.1117/12.818827
Peter Coward, Roger Appleby
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 730904 (2009) https://doi.org/10.1117/12.819852
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 730905 (2009) https://doi.org/10.1117/12.818699
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 730906 (2009) https://doi.org/10.1117/12.811996
Systems
Christopher M. Persons, Christopher A. Martin, Michael W. Jones, Vladimir Kolinko, John A. Lovberg
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 730907 (2009) https://doi.org/10.1117/12.817611
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 730908 (2009) https://doi.org/10.1117/12.818858
David Wikner, Erich Grossman
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 730909 (2009) https://doi.org/10.1117/12.821197
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 73090A (2009) https://doi.org/10.1117/12.820827
Security
Jonathan Drewes, Robert P. Daly
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 73090B (2009) https://doi.org/10.1117/12.819364
Markus Peichl, Stephan Dill, Matthias Jirousek, Helmut Süß
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 73090C (2009) https://doi.org/10.1117/12.820619
Naomi Alexander, Carlos Callejero, Franco Fiore, Ignacio Gómez, Ramón Gonzalo, Álvaro Enríquez de Luna, Iñigo Ederra, Inés Palacios
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 73090D (2009) https://doi.org/10.1117/12.818614
T. May, G. Zieger, S. Anders, V. Zakosarenko, H.-G. Meyer, M. Schubert, M. Starkloff, M. Rößler, G. Thorwirth, et al.
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 73090E (2009) https://doi.org/10.1117/12.818524
Arttu Luukanen, Panu Helistö, Petteri Lappalainen, Mikko Leivo, Anssi Rautiainen, Hans Toivanen, Heikki Seppä, Zach Taylor, Charles R. Dietlein, et al.
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 73090F (2009) https://doi.org/10.1117/12.821996
Douglas L. McMakin, Paul E. Keller, David M. Sheen, Thomas E. Hall
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 73090G (2009) https://doi.org/10.1117/12.817882
David A. Andrews, Sarah Smith, Nacer Rezgui, Nicholas Bowring, Matthew Southgate, Stuart Harmer
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 73090H (2009) https://doi.org/10.1117/12.818875
David M. Sheen, Thomas E. Hall, Ronald H. Severtsen, Douglas L. McMakin, Brian K. Hatchell, Patrick L. J. Valdez
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 73090I (2009) https://doi.org/10.1117/12.817927
Device Technology
Douglas R. Denison, Michael E. Knotts, Michael E. McConney, Vladimir V. Tsukruk
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 73090J (2009) https://doi.org/10.1117/12.818387
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 73090K (2009) https://doi.org/10.1117/12.818051
Peng Yao, Christopher A. Schuetz, Shouyuan Shi, Julien Macario, Rownak Shireen, Dennis W. Prather
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 73090L (2009) https://doi.org/10.1117/12.819039
F. F. Sizov, V. Dobrovolsky, V. Zabudsky, Yu. Kamenev, N. Momot, J. Gumenjuk-Sychevska
Proceedings Volume Passive Millimeter-Wave Imaging Technology XII, 73090M (2009) https://doi.org/10.1117/12.819924
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