Long life 12" W-O type optical disks

Akira Gotoh; Shuhei Nakamichi; Shinkichi Horigome

doi:10.1117/12.952740

19 May 1989 Long life 12" W-O type optical disks

Akira Gotoh, Shuhei Nakamichi, Shinkichi Horigome

Proceedings Volume 1078, Optical Data Storage Topical Meeting; (1989) https://doi.org/10.1117/12.952740
Event: OE/LASE '89, 1989, Los Angeles, CA, United States

Abstract

Newly developed automated clean process has made it possible to produce 12" W-0 type optical disks with average defect rate of 3 x 10^-7(1/bit). Using these disks with ultra low defect rates, accelerated life tests were performed. No disks showed any degradation in bit error rate during the high temperature and high humidity test(60Â°C;90%RH) of one year and the heat cycle test up to 1000 times between -40°C;3 hours and 80°C;3 hours. The acceleration coefficient for 60°C;90%RH referred to 25°C;90%RH was estimated to be more than 100.

Citation Download Citation

Akira Gotoh, Shuhei Nakamichi, and Shinkichi Horigome "Long life 12" W-O type optical disks", Proc. SPIE 1078, Optical Data Storage Topical Meeting, (19 May 1989); https://doi.org/10.1117/12.952740

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