Paper
16 December 2013 Electrical properties of polycrystalline mercuric iodide detector
Yang Liao, Dongmei Li, Jirong Li, Jun Qian, Weimin Shi, Weiguang Yang, Shuyi Lu, Jin Liu, Juan Qin
Author Affiliations +
Proceedings Volume 9068, Eighth International Conference on Thin Film Physics and Applications; 90680N (2013) https://doi.org/10.1117/12.2053108
Event: Eighth International Conference on Thin Film Physics and Applications (TFPA13), 2013, Shanghai, China
Abstract
Potentially low cost and large area polycrystalline mercuric iodide is one of the preferred materials for the fabrication of room temperature X-ray and gamma-ray detectors. The properties of the contact between electrode and film play an important role in the performance of the polycrystalline mercuric iodide detector. The crystalline structure of the as-deposited polycrystalline α-HgI2 films were characterized by XRD. The surface morphology of the films was obtained by optical microscope and scan electron microscopes (SEM). And the I-V curve and the response to 241Am were measured after evaporating Au electrode. The energy resolution of 241Am α particles at room temperature was obtained.
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Yang Liao, Dongmei Li, Jirong Li, Jun Qian, Weimin Shi, Weiguang Yang, Shuyi Lu, Jin Liu, and Juan Qin "Electrical properties of polycrystalline mercuric iodide detector", Proc. SPIE 9068, Eighth International Conference on Thin Film Physics and Applications, 90680N (16 December 2013); https://doi.org/10.1117/12.2053108
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KEYWORDS
Sensors

Gold

Electrodes

Particles

Scanning electron microscopy

Crystals

X-rays

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