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Andreas Jaggi
at Paul Scherrer Institut
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 18 September 2018 Presentation + Paper
Inspecting adaptive optics with at-wavelength wavefront metrology
J. Krempaský, F. Koch, P. Vagovič, L. Mikeš, A. Jaggi, C. Svetina, U. Flechsig, L. Patthey, S. Marathe, D. Batey, S. Cipiccia, C. Rau, F. Seiboth, M. Seaberg, C. David, U. Wagner
Proceedings Volume 10761, 107610D (2018) https://doi.org/10.1117/12.2320532
KEYWORDS: Mirrors, X-rays, Adaptive optics, X-ray optics, Wavefront distortions, Wavefront analysis, Lenses, Wavefront metrology, Light sources, Wavefront aberrations
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