Dr. Arvin Emadi Profile

Dr. Arvin Emadi

at Illumina, Inc

SPIE Involvement:

Author

Publications (10)

Proceedings Article | 2 May 2014 Paper

Design, fabrication and characterization of LVOF-based IR microspectrometers

N. P. Ayerden, M. Ghaderi, M. Silva, A. Emadi, P. Enoksson, J. Correia, G. de Graaf, R. Wolffenbuttel

Proceedings Volume 9130, 91300T (2014) https://doi.org/10.1117/12.2052620

KEYWORDS: Silicon, Optical filters, Silica, Absorption, Sensors, Reflectors, Mirrors, Thin films, Fabry–Perot interferometers, Transmittance

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Proceedings Article | 9 May 2012 Paper

Design, fabrication and measurements with a UV linear-variable optical filter microspectrometer

Arvin Emadi, Huaiwen Wu, Ger de Graaf, Peter Enoksson, José Higino Correia, Reinoud Wolffenbuttel

Proceedings Volume 8439, 84390V (2012) https://doi.org/10.1117/12.922374

KEYWORDS: Ultraviolet radiation, Optical filters, Calibration, Lamps, Signal processing, Monochromators, Filtering (signal processing), Cameras, Mercury, Silica

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Proceedings Article | 9 May 2012 Paper

Design and implementation of IR microspectrometers based on linear-variable optical filters

Arvin Emadi, Huaiwen Wu, Ger de Graaf, Reinoud Wolffenbuttel

Proceedings Volume 8439, 84391O (2012) https://doi.org/10.1117/12.922320

KEYWORDS: Optical filters, Silica, Silicon, Infrared sensors, Detector arrays, Sensors, Infrared detectors, Semiconducting wafers, Spectroscopy, Absorption

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Proceedings Article | 14 May 2010 Paper

Spectral measurement using IC-compatible linear variable optical filter

Arvin Emadi, Semen Grabarnik, Huaiwen Wu, Ger de Graaf, Karin Hedsten, Peter Enoksson, Jose Higino Correia, Reinoud Wolffenbuttel

Proceedings Volume 7716, 77162G (2010) https://doi.org/10.1117/12.854548

KEYWORDS: Silica, Neon, Lamps, Cameras, Fabry–Perot interferometers, Optical filters, Sensors, Current controlled current source, Lithography, Titanium dioxide

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Proceedings Article | 14 May 2010 Paper

A CMOS 128-APS linear array integrated with a LVOF for highsensitivity and high-resolution micro-spectrophotometry

Chi Liu, Arvin Emadi, Huaiwen Wu, Ger de Graaf, Reinoud Wolffenbuttel

Proceedings Volume 7726, 772616 (2010) https://doi.org/10.1117/12.854584

KEYWORDS: Control systems, Photodetectors, Switches, Signal detection, Signal to noise ratio, Sensors, Interference (communication), Standards development, Optical filters, CMOS technology

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Proceedings Article | 14 May 2010 Paper

Thin film encapsulated 1D thermoelectric detector in an IR microspectrometer

Huaiwen Wu, Arvin Emadi, Ger de Graaf, Reinoud Wolffenbuttel

Proceedings Volume 7726, 772612 (2010) https://doi.org/10.1117/12.854182

KEYWORDS: Thermography, Etching, Thin films, Silicon carbide, Chemical elements, Detector arrays, Infrared sensors, Sensors, Bridges, Infrared detectors

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Proceedings Article | 28 April 2010 Paper

CMOS-compatible LVOF-based visible microspectrometer

Arvin Emadi, Huaiwen Wu, Ger de Graaf, Reinoud Wolffenbuttel

Proceedings Volume 7680, 76800W (2010) https://doi.org/10.1117/12.849844

KEYWORDS: Silica, Fabry–Perot interferometers, Etching, Dielectric mirrors, Spectroscopy, Photoresist materials, Optical filters, Lithography, Dielectrics, Titanium dioxide

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Proceedings Article | 28 April 2010 Paper

Encapsulated thermopile detector array for IR microspectrometer

Huaiwen Wu, Arvin Emadi, Ger de Graaf, Reinoud Wolffenbuttel

Proceedings Volume 7680, 76800Z (2010) https://doi.org/10.1117/12.849994

KEYWORDS: Etching, Thermography, Silicon carbide, Detector arrays, Bridges, Chemical elements, Thin films, Infrared imaging, Infrared detectors, Sensors

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Proceedings Article | 14 May 2008 Paper

Concave diffraction gratings fabricated with planar lithography

S. Grabarnik, A. Emadi, H. Wu, G. De Graaf, R. Wolffenbuttel

Proceedings Volume 6992, 699214 (2008) https://doi.org/10.1117/12.781057

KEYWORDS: Diffraction gratings, Lithography, Spectrometers, Semiconducting wafers, Spectrographs, Microelectromechanical systems, Glasses, CCD cameras, Spectral resolution, Optical alignment

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Proceedings Article | 14 May 2008 Paper

IC-compatible microspectrometer using a planar imaging diffraction grating

S. Grabarnik, A. Emadi, H. Wu, G. De Graaf, G. Vdovin, R. Wolffenbuttel

Proceedings Volume 6992, 699215 (2008) https://doi.org/10.1117/12.781103

KEYWORDS: Spectroscopy, Diffraction gratings, Spectral resolution, Glasses, Diffraction, Optical design, Lithography, Image sensors, Imaging systems, Semiconducting wafers

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Showing 5 of 10 publications

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