Bofan Wang
student at Shanghai Institute of Optics and Fine Mechanics
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 31 December 2010 Paper
Bofan Wang, Zhongliang Li, Xiangzhao Wang, Peng Bu
Proceedings Volume 7544, 754447 (2010) https://doi.org/10.1117/12.885662
KEYWORDS: Distance measurement, Modulation, Interferometers, Scanning probe microscopy, Phase shift keying, Phase measurement, Signal detection, Semiconductor lasers, Error analysis, Bessel functions

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