Dr. Bruno Frei Profile

Dr. Bruno Frei

Head of Technology, Innovation and Administration

SPIE Involvement:

Author

Area of Expertise:

Lasers , Photovoltaics , Optics , Laser processing

Websites:

Company Website

Publications (5)

Proceedings Article | 13 March 2013 Paper

Investigation of a reliable all-laser scribing process in thin film Cu(In,Ga)(S,Se)2 manufacturing

Reiner Witte, Bruno Frei, Stefan Schneeberger, Stephan Bücheler, Shiro Nishiwaki, Andreas Burn, Martin Muralt, Valerio Romano, Lukas Krainer

Proceedings Volume 8607, 86071B (2013) https://doi.org/10.1117/12.2003872

KEYWORDS: Copper indium gallium selenide, Molybdenum, Transparent conductors, Picosecond phenomena, Laser processing, Resistance, Pulsed laser operation, Laser ablation, Manufacturing, Coating

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Proceedings Article | 16 February 2012 Paper

Selective ablation of thin films in latest generation CIGS solar cells with picosecond pulses

Andreas Burn, Valerio Romano, Martin Muralt, Reiner Witte, Bruno Frei, Stephan Bücheler, Shiro Nishiwaki

Proceedings Volume 8243, 824318 (2012) https://doi.org/10.1117/12.906919

KEYWORDS: Picosecond phenomena, Copper indium gallium selenide, Molybdenum, Laser ablation, Transparent conductors, Thin films, Solar cells, Photomicroscopy, Thin film solar cells, Pulsed laser operation

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Proceedings Article | 22 February 2011 Paper

Innovative laser based solar cell scribing

Bruno Frei, Stefan Schneeberger, Reiner Witte

Proceedings Volume 7920, 792011 (2011) https://doi.org/10.1117/12.877060

KEYWORDS: Glasses, Fiber lasers, Solar cells, Transparent conductors, Particles, Silicon, Laser sources, Manufacturing, Laser processing, Photovoltaics

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Proceedings Article | 9 May 2009 Paper

High-power laser diodes at SCD: performance and reliability for defence and space applications

Shlomo Risemberg, Yoram Karni, Genadi Klumel, Moshe Levy, Yuri Berk, Markus Rech, Hubert Becht, Bruno Frei

Proceedings Volume 7325, 73250U (2009) https://doi.org/10.1117/12.817729

KEYWORDS: Single crystal X-ray diffraction, Reliability, Semiconductor lasers, Diodes, Packaging, Manufacturing, Semiconducting wafers, High power lasers, Head, Defense and security

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Proceedings Article | 24 February 2009 Paper

Space-grade reliability of 808nm QCW laser diode arrays (LDAs) delivering over 20 billion shots

Yuri Berk, Yoram Karni, Genadi Klumel, Moshe Levy, Yaki Openhaim, Shlomo Risemberg, Markus Rech, Hubert Becht, Bruno Frei, Fabrice Monti di Sopra

Proceedings Volume 7198, 71980C (2009) https://doi.org/10.1117/12.808828

KEYWORDS: Single crystal X-ray diffraction, Semiconductor lasers, Reliability, Manufacturing, Semiconducting wafers, Packaging, Laser welding, Collimation, Planets, Optics manufacturing

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