KEYWORDS: Chromium, Film thickness, Coating stress, Thin films, Thin film coatings, Design, Data modeling, Surface roughness, Reflectivity, Data acquisition
NewAthena (New Advanced Telescope for High–Energy Astrophysics) has been endorsed by the European Space Agency in November 2023 and the mission is entering a pre–industrialization phase prior to the foreseen adoption early 2027.
A key aspect of the thin film coating development for the NewATHENA X–ray optics, is to determine the adhesion efficiency and the residual stress limitation of the coatings on silicon substrates. To do so, we magnetron sputtered different layer thicknesses of chromium layers underneath iridium/carbon bilayer and linear graded multilayer coatings. The samples were characterized using X–ray Reflectometry (XRR) to derive the thickness and micro–roughness. The residual stress was assessed by profilometry using a Dektak 150 stylus profilometer. The curvature of the samples before and after coating, along with the total film thickness derived from XRR, was used to evaluate the residual stress.
Development and qualification of X-ray reflective mirror coatings for the NewAthena mission is progressing with a focus on enabling scientific capabilities of the telescope, given the updated requirements of the redefined mission. In this work, we consider both design and development of Ir/C multilayer coatings optimised to ensure the required performance across the spectral range, facilitating the mission science objectives. We present demonstration of manufacturing capability for the optimised Ir/C multilayer coatings, and compatibility with the Silicon Pore Optics (SPO) technology. Characterisation of X-ray mirror coatings is performed using X-ray reflectometry with a focus on mirror design qualification and long-term stability.
X-ray detectors for space astrophysics missions are susceptible to noise caused by photons with energies outside the operating energy range; for this reason, efficient external optical blocking filters are required to shield the detector from the out-of-band radiation. These filters play a crucial role in meeting the scientific requirements of the X-ray detectors, and their proper operation over the life of the mission is essential for the success of the experimental activity. We studied thin sandwich membranes made of silicon nitride and aluminum as optical blocking filters for high-energy detectors in space missions. Here, we report the results of a multi-technique characterization of SiN membranes with thicknesses in the range from 40 nm to 145 nm coated with few tens of nanometers of aluminum on both sides. In particular, we have measured the X-ray transmission at synchrotron radiation beamlines, the rejection of ultraviolet, visible, and near-infrared radiation, the amount of native oxide on the aluminum surfaces by X-ray photoelectron spectroscopy, the morphology of the sample surfaces by atomic force microscopy, and the aging effects under proton irradiation.
It has been known for some time that sputtered low-density coatings deposited under vacuum (e.g. carbon or B4C), applied on top of high-density metallic coatings, can enhance the reflectivity in the soft x-ray band (below ~5 keV). In the last years, we experimented with novel carbonated coatings obtained by dip-liquid deposition, in which a thin film is formed on the surface of a mirror by immersion in a suitable precursor solution. After several attempts with different chemical compounds, we found an optimal candidate both for the reflectivity performance and for the convenience of the deposition process, which is much simpler and inexpensive compared to conventional processes. In particular, such coatings can enhance the soft x-ray response at the reflection angles employed in future telescopes, like ATHENA (ESA), Lynx (NASA) and eXTP (CAS). In this paper we consider the application of dip-liquid overcoatings on conventional coatings (Au, Ir) or in combination with recently proposed chromium overcoatings and their possible uses to enhance the reflectivity of x-ray mirrors at low, medium or higher energies, presenting the first experimental results of x-ray tests on these coatings.
The thin film deposition technology for fabrication of the mirror optics for the Advanced Telescope for HighEnergy Astrophysics (ATHENA) has been established. Numerous coating process parameters impact the quality of the thin films. Defining a margin within the coating process parameter space, where the deposited thin film performs similar in X-ray reflectivity is key to avoid unforeseen risks within the coating process for the ATHENA flight optics production. In this work, we investigate the coating process parameter influence on the thin film properties with a focus on micro roughness, deposition rate and residual film stress when deposited under various process conditions. The thin films were produced by varying the following three coating process parameters: discharge power, discharge voltage and working gas pressure. The thin films were characterized using X–ray reflectometry at 3.4–10.0 keV. A main result of this work is that the residual stress of single layer iridium and boron carbide films can be reduced by a factor of approximately two, by increasing the working gas pressure while maintaining a high film quality.
The future Athena observatory will feature optics with unprecedented collecting area enabled by silicon pore optics technology. In order to achieve the telescope effective area requirements at 1 keV and 7 keV, thin film coatings of iridium with a low-density overcoat are deposited onto the mirror substrates. Assembling the coated silicon pore optics plates into mirror modules for the Athena optics requires wet chemical processing and thermal annealing. While iridium appears to be compatible with the post-coating processes, previous studies have shown degradation of the low-density material. The overcoat layer is particularly critical for the low-energy telescope performance, so several candidate materials (boron carbide, silicon carbide and carbon) have been studied to identify a compatible thin film design. We present the characterisation of x-ray mirror performance using x-ray reflectometry, as well as the measurements of residual film stress with stylus profilometry. Furthermore, we evaluate the effects of post-coating treatment in order to recommend the most suitable overcoat material for the telescope.
In this paper, we present the first results from an investigation performed on nanometric thin pellicles based on carbon nanotubes (CNT) of potential interest for manufacturing large area optical blocking filters to protect soft x-ray detectors in astrophysics space missions. In order to evaluate the effective capability of such materials to block UV/VIS/IR radiation, while being highly transparent in the soft x-rays and strong enough to withstand the severe launch stresses, we have performed a suite of characterization measurements. These include: UV/VIS/IR and x-ray absorption spectroscopy, x-ray photoelectron spectroscopy and scanning electron microscopy on bare and Al coated small self-standing pellicles; static mechanical tests on small freestanding samples.
As part of the manufacturing process of mirror modules for the Athena X-ray telescope, Silicon Pore Optics plates are assembled into mirror module stacks. The plates that form each stack are held together by direct bonding, relying on van der Waals forces and covalent bonds for adhesion. One way to increase the strength of the covalent bonds is through annealing of the mirror stacks. It is of critical importance to the mission to ensure compatibility between the reflective coating and any post-coating processing of the plates. We present our findings of the impact of annealing on the X-ray re ectance of coated mirrors relevant for the Athena mission. These are Ir single layers, as well as Ir/B4C, Ir/SiC, and Ir/C bilayers. We investigate the effect on the performance of the coatings after annealing at atmospheric pressure and at a low vacuum using X-ray reflectometry. B4C is found to suffer degradation from annealing under atmospheric conditions but not when annealed in vacuum. All other materials investigated are robust to atmospheric annealing.
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