Temporal phase-shifting interferometry technique (TPSI) has high accuracy in surface topography metrology and has been designing to diagnose the surface variation of plasma-facing materials (PFMs) in Tokamak. But the mechanical vibration of the Tokamak device will lead to the decrease of the measurement accuracy or even incorrect result. In order to solve the problem more, it is much desired to study the influence of the vibration on the topographic measurement in the broad parameter scope. Series experiments in the different vibration frequencies, amplitudes, modes and different deformation amounts and detection wavelengths were carried out in this work.
Monitoring the deformation caused by wall erosion and deposition on the Plasma-Facing Components (PFCs) in tokamak has been essential issues for the maintenance of a long duration plasma discharge and safety. As an in situ, real-time and non-destructive optical diagnostic technique, Laser Speckle Interferometry (LSI) based on temporal phase-shifting approach has been considered as the most potential approach for the measurement of erosion and deposition on PFCs. This paper focuses on the measurement of the deposition morphology and thickness based on the temporal phase-shifting laser speckle interferometry. Here the deposition was conducted by Pulse Laser Deposition (PLD) in a vacuum chamber, which is simulated to the deposition process on PFCs. The LSI measurements are compared with those of profilometry and the results show that the temporal phase-shifting laser speckle interferometry is capable of online measuring deposition morphology as well as thickness. The LSI approach has great possibility for the further application on the real-time monitoring impurity and fuel deposition on PFCs in fusion devices.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.