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Dace Su

at Shanghai Jiao Tong Univ

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Proceedings Article | 8 November 2024 Paper

All-optical terahertz-driven ultrafast photogun

Jianwei Ying, Xie He, Dace Su, Lingbin Zheng, Tobias Kroh, Timm Rohwer, Moein Fakhari, Günther Kassier, Jingui Ma, Peng Yuan, Nicholas Matlis, Franz Kärtner, Dongfang Zhang

Proceedings Volume 13247, 1324705 (2024) https://doi.org/10.1117/12.3036297

KEYWORDS: Terahertz radiation, Diffraction, Ultrafast imaging, Ultrafast phenomena, Electron microscopy, Electron beams

Read Abstract +

Terahertz (THz)-based electron acceleration has potential as a technology for next-generation cost-efficient compact electron sources. Here we present a novel millimeter-scale multicell waveguide-based THz-driven photogun that exploits field enhancement to boost the electron energy, a movable cathode to achieve precise control over the accelerating phase as well as multiple cells for exquisite beam control. The short driving wavelength enables a peak acceleration gradient as high as ~3 GV m⁻¹. Using microjoule-level single-cycle THz pulses, we demonstrate electron beams with up to ~14 keV electron energy, 1% energy spread and ~0.015 mm mrad transverse emittance. With a highly integrated rebunching cell, the bunch is further compressed by about ten times to 167 fs with ~10 fC charge. High-quality diffraction patterns of single-crystal silicon and projection microscopy images of the copper mesh are achieved. We are able to reveal the transient radial electric field developed from the charged particles on a copper mesh after photoexcitation with high spatio-temporal resolution, providing a potential scheme for plasma-based beam manipulation. Overall, these results represent a new record in energy, field gradient, beam quality and control for a THz-driven electron gun, enabling real applications in electron projection microscopy and diffraction. This is therefore a critical step and milestone in the development of all-optical THz-driven electron devices, validating the maturity of the technology and its use in precision applications.

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