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Dr. David Cohen
Process Engineer at Tower Semiconductor Ltd
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Publications (1)
Proceedings Article | 5 July 2000 Paper
Characterization of leveling modes on i-line stepper
Amir Wachs, David Cohen, Ayelet Margalit-Ilovich
Proceedings Volume 4000, (2000) https://doi.org/10.1117/12.389076
KEYWORDS: Semiconducting wafers, Metals, Sensors, CCD image sensors, Optical lithography, Scanning electron microscopy, Image sensors, CCD cameras, Imaging systems, Halogens
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