Dimitrios Tsamados
at Synopsys Switzerland LLC
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 23 March 2020 Presentation + Paper
Proceedings Volume 11327, 113270I (2020) https://doi.org/10.1117/12.2552102
KEYWORDS: Semiconducting wafers, Silicon, Etching, Oxides, Ions, Photomasks, Optical proximity correction, Lithography, Process modeling

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