Dr. Farhad Larki
Postdoctoral Fellow at Isfahan Univ of Technology
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | 23 December 2017
JM3, Vol. 16, Issue 04, 044501, (December 2017) https://doi.org/10.1117/12.10.1117/1.JMM.16.4.044501
KEYWORDS: Particles, Dielectrophoresis, Etching, Aluminum, Finite element methods, Electronic filtering, Device simulation, Electrodes, Photoresist processing, Scanning electron microscopy

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