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Prof. Giovanni G. Berti
at XRD-Tools
SPIE Involvement:
Author
Publications (3)
Proceedings Article | 11 September 2014 Paper
NanoXCT: development of a laboratory nano-CT system
F. Nachtrab, M. Firsching, N. Uhlmann, C. Speier, P. Takman, T. Tuohimaa, C. Heinzl, J. Kastner, D. Larsson, A. Holmberg, G. Berti, M. Krumm, C. Sauerwein
Proceedings Volume 9212, 92120L (2014) https://doi.org/10.1117/12.2061752
KEYWORDS: Sensors, X-rays, Prototyping, X-ray optics, X-ray detectors, Inspection, Detector development, Time metrology, Calibration, Signal to noise ratio
Proceedings Article | 28 April 2006 Paper
X-ray diffraction in optical microsystems technology
Proceedings Volume 6188, 61880X (2006) https://doi.org/10.1117/12.662498
KEYWORDS: Diffraction, X-ray diffraction, Calibration, X-rays, Physics, Metrology, Data modeling, Surface finishing, Testing and analysis, Surface properties
Proceedings Article | 22 September 2005 Paper
At-distance controlled diffractometer for XRD measurements in field
Proceedings Volume 5906, 590611 (2005) https://doi.org/10.1117/12.618639
KEYWORDS: Diffraction, X-ray diffraction, Calibration, Crystals, Sensors, Collimation, Robotics, Aerospace engineering, Data modeling, Data processing
Conference Committee Involvement (2)
Instruments, Methods, and Missions for Astrobiology IX
14 August 2006 | San Diego, California, United States
Instruments, Methods, and Missions for Astrobiology IX
31 July 2005 | San Diego, California, United States
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