Hideaki Sakurai
at KIOXIA Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 23 August 2021 Paper
Yoshinori Kagawa, Machiko Suenaga, Hikaru Sasaki, Koji Murano, Shunko Magoshi, Ryu Komatsu, Kosuke Takai, Mitsuru Kondo, Hideaki Sakurai, Shingo Kanamitsu
Proceedings Volume 11908, 119080D (2021) https://doi.org/10.1117/12.2603907
KEYWORDS: Forward error correction, Critical dimension metrology, Nanoimprint lithography, Double patterning technology, Lithography, Scanning electron microscopy, Nanolithography, Image processing, Semiconducting wafers, Etching

Proceedings Article | 26 October 2020 Presentation + Paper
Proceedings Volume 11518, 115180H (2020) https://doi.org/10.1117/12.2572389
KEYWORDS: Inspection, Defect inspection, Scanning electron microscopy, Double patterning technology, Nanoimprint lithography, High volume manufacturing, Electron microscopes, Scatterometry, Microscopes, Coherence imaging

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