The g-r noise in semiconductor lasers and its relation with device quality and reliability are studied. The results indicated that g-r noise has close relation with semiconductor defects, the devices with g-r noise degrade rapidly during electric aging, the P-I characteristics of the devices evidently become bad, or the devices have failed after aging. By measuring g-r noise in semiconductor lasers, the devices quality and reliability can be estimated, which is an effective and non-destructive method.
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