Ignat Moskalenko
at Siemens Digital Industries Software
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 13 June 2022 Presentation + Paper
Proceedings Volume 12052, 120520Q (2022) https://doi.org/10.1117/12.2614118
KEYWORDS: Optimization (mathematics), Calibration, Data modeling, Optical proximity correction, Binary data, Performance modeling, Genetic algorithms, Process modeling, Computer simulations, Precision calibration

Proceedings Article | 13 June 2022 Presentation
Proceedings Volume PC12056, PC1205605 (2022) https://doi.org/10.1117/12.2614280
KEYWORDS: Etching, Reactive ion etching, Optical proximity correction, Neural networks, Machine learning, Ions

Proceedings Article | 22 February 2021 Paper
Proceedings Volume 11613, 116130H (2021) https://doi.org/10.1117/12.2584771
KEYWORDS: SRAF, 3D modeling, Printing, Data modeling, 3D printing

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