Prof. Jing Xi
at The 54th Research Institute of China Electronics T
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 May 2022 Paper
Proceedings Volume 12245, 1224502 (2022) https://doi.org/10.1117/12.2635836
KEYWORDS: Velocity measurements, Oscillators, Modulation, Frequency modulation, Fermium, Error analysis, Phase shift keying, Time metrology, Single sideband modulation, S band

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