Dr. Joanna Schmit Profile
Dr. Joanna Schmit
Optical Engineer at 4D Technology Corp
SPIE Involvement:
Awards Committee | Conference Program Committee | Author | Editor
Publications (30)

Proceedings Article | 9 September 2021 Open Access Presentation + Paper
Proceedings Volume 11813, 1181308 (2021) https://doi.org/10.1117/12.2569459
KEYWORDS: Interferometers, Interferometry, Phase shifts, Optical metrology, Phase interferometry, Optical testing, Holography, Fringe analysis, Computer generated holography, Microscopes

Proceedings Article | 7 September 2018 Paper
Joanna Schmit, Erik Novak, Shawn McDermed
Proceedings Volume 10834, 108342F (2018) https://doi.org/10.1117/12.2322178
KEYWORDS: Structured light, Inspection, 3D metrology, Fringe analysis, Polarization, Interferometry

Proceedings Article | 1 September 2015 Paper
Proceedings Volume 9576, 957607 (2015) https://doi.org/10.1117/12.2190352
KEYWORDS: Interferometry, 3D metrology, Objectives, Microscopes, 3D image processing, Image processing, RGB color model, Mirrors, Cameras, Visualization

Proceedings Article | 13 November 2014 Paper
Proceedings Volume 9276, 92760I (2014) https://doi.org/10.1117/12.2071276
KEYWORDS: Scanners, Error analysis, Demodulation, Mirrors, 3D metrology, 3D scanning, Optical interferometry, Interferometers, Microscopes, Spherical lenses

SPIE Journal Paper | 17 September 2014 Open Access
OE, Vol. 53, Issue 09, 092001, (September 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.9.092001
KEYWORDS: Optical fabrication, Optical testing, Optics manufacturing, Metrology, Optical engineering, Optical components, Surface finishing, Precision optics, Thin films, Magnetorheological finishing

Proceedings Article | 28 May 2014 Paper
Joanna Schmit, Son Bui, Oh-Kyu Kwon, Dong Chen
Proceedings Volume 9110, 91100N (2014) https://doi.org/10.1117/12.2053485
KEYWORDS: 3D metrology, Light emitting diodes, Mirrors, Objectives, Microscopes, Metrology, Sapphire, Manufacturing, Interferometry, Temperature metrology

Proceedings Article | 15 October 2012 Paper
Proceedings Volume 8483, 84830B (2012) https://doi.org/10.1117/12.958602
KEYWORDS: Polishing, Radiometry, Visible radiation, Infrared radiation, Iron, Curtains, Radio optics, Optical testing, Roads, Laser applications

Proceedings Article | 17 June 2009 Paper
Proceedings Volume 7389, 73890P (2009) https://doi.org/10.1117/12.828113
KEYWORDS: Gaussian filters, Surface roughness, Surface finishing, 3D metrology, Ceramics, Microscopes, Optical interferometry, Metrology, Optical testing, Standards development

Proceedings Article | 11 August 2008 Paper
Florin Munteanu, Joanna Schmit
Proceedings Volume 7063, 70630L (2008) https://doi.org/10.1117/12.797473
KEYWORDS: Phase measurement, Phase interferometry, Interferometry, Iterative methods, Light sources, Mirrors, Scanners, Algorithm development, Optical filters, Cameras

SPIE Journal Paper | 1 July 2007
Joanna Schmit, Parameswaran Hariharan
OE, Vol. 46, Issue 07, 077007, (July 2007) https://doi.org/10.1117/12.10.1117/1.2751166
KEYWORDS: Microscopes, Phase shifts, Polarization, Beam splitters, Interferometers, Mirau interferometers, Visibility, Optical engineering, Phase shifting, Linear polarizers

SPIE Journal Paper | 1 November 2006
Joanna Schmit, Parameswaran Hariharan
OE, Vol. 45, Issue 11, 115602, (November 2006) https://doi.org/10.1117/12.10.1117/1.2387882
KEYWORDS: Interferometry, Algorithm development, Phase measurement, Tolerancing, Phase shifts, Detection and tracking algorithms, Mirau interferometers, Ferroelectric materials, 3D displays, Optical engineering

Proceedings Article | 14 August 2006 Paper
Sanjit Debnath, Mahendra Kothiyal, Joanna Schmit, Parameswaran Hariharan
Proceedings Volume 6292, 629214 (2006) https://doi.org/10.1117/12.679484
KEYWORDS: Thin films, Phase shifts, Phase interferometry, Phase measurement, Refractive index, Ferroelectric materials, Interferometry, Phase shifting, Silicon, Spectroscopy

Proceedings Article | 14 August 2006 Paper
Jason Reed, Paul Wilkinson, Keith O'Doherty, Joanna Schmit, Sen Han, Josh Troke, Michael Teitell, William Klug, James Gimzewski
Proceedings Volume 6293, 629301 (2006) https://doi.org/10.1117/12.683948
KEYWORDS: Interferometry, Metrology, Imaging systems, Live cell imaging, Microscopy, Diagnostics, Mode conditioning cables, Mirrors, Profiling, Silicon

Proceedings Article | 20 October 2005 Paper
Joanna Schmit, Florin Munteanu
Proceedings Volume 5965, 59650Z (2005) https://doi.org/10.1117/12.627764
KEYWORDS: Radium, Phase shifts, Phase interferometry, Modulation, Mirrors, Scanners, Phase shift keying, Phase measurement, Cameras, Error analysis

Proceedings Article | 2 August 2004 Paper
Joanna Schmit, Paul Unruh, Der-Shen Wan
Proceedings Volume 5531, (2004) https://doi.org/10.1117/12.563911
KEYWORDS: Objectives, Mirrors, Microscopes, Distance measurement, Interferometry, Calibration, Interferometers, Bandpass filters, Motion measurement, Fringe analysis

Proceedings Article | 22 December 2003 Paper
Proceedings Volume 5180, (2003) https://doi.org/10.1117/12.504930
KEYWORDS: Calibration, Scanners, Interferometers, Interferometry, Optical calibration, Signal detection, Motion measurement, Objectives, Standards development, Optical filters

Proceedings Article | 20 November 2003 Paper
Proceedings Volume 5190, (2003) https://doi.org/10.1117/12.506946
KEYWORDS: Scanners, Calibration, Interferometry, Signal detection, Standards development, Motion measurement, Helium neon lasers, Optical testing, Objectives, Interferometers

Proceedings Article | 30 May 2003 Paper
Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.501035
KEYWORDS: Scanners, Cameras, Modulation, Signal detection, Calibration, Phase shift keying, Optical testing, Interferometers, Phase shifts, Interference (communication)

SPIE Journal Paper | 1 January 2003
OE, Vol. 42, Issue 01, (January 2003) https://doi.org/10.1117/12.10.1117/1.1523942
KEYWORDS: Scanners, Interferometers, Signal detection, Interferometry, Light sources, Calibration, Sensors, Beam splitters, Motion measurement, Cameras

Proceedings Article | 20 June 2002 Paper
Proceedings Volume 4777, (2002) https://doi.org/10.1117/12.472211
KEYWORDS: Scanners, Interferometry, Phase interferometry, Phase measurement, Phase shifting, Interferometers, Fringe analysis, Coherence (optics), Optical interferometry, Microscopes

Proceedings Article | 20 June 2002 Paper
Joanna Schmit, Artur Olszak, Shawn McDermed
Proceedings Volume 4777, (2002) https://doi.org/10.1117/12.472209
KEYWORDS: Scanners, Interferometers, Interferometry, Sensors, Signal detection, Motion measurement, Signal processing, Beam splitters, Light sources, Optical interferometry

Proceedings Article | 5 June 2001 Paper
Proceedings Volume 4275, (2001) https://doi.org/10.1117/12.429351
KEYWORDS: Reflectivity, Glasses, Silver, Interferometry, Optical filters, Signal to noise ratio, Cameras, Microscopes, Mirrors, Phase shifts

Proceedings Article | 13 August 1999 Paper
Proceedings Volume 3744, (1999) https://doi.org/10.1117/12.357713

SPIE Journal Paper | 1 August 1997
OE, Vol. 36, Issue 08, (August 1997) https://doi.org/10.1117/12.10.1117/1.601446
KEYWORDS: Polarization, Diffraction, Diffraction gratings, Interferometers, Beam splitters, Cameras, Interferometry, Mirrors, Image registration, Prisms

Proceedings Article | 18 September 1996 Paper
Proceedings Volume 2782, (1996) https://doi.org/10.1117/12.250754
KEYWORDS: Microscopes, Phase shifts, Interferometry, Electronics, Computing systems, Phase interferometry, Phase measurement

Proceedings Article | 14 June 1995 Paper
Proceedings Volume 2544, (1995) https://doi.org/10.1117/12.211855
KEYWORDS: Phase shifts, Phase measurement, Detection and tracking algorithms, Fringe analysis, Linear filtering, Algorithm development, CCD cameras, Phase shift keying, Gallium, Moire patterns

Proceedings Article | 12 December 1994 Paper
Proceedings Volume 2340, (1994) https://doi.org/10.1117/12.195908
KEYWORDS: Phase shifts, Sensors, Phase measurement, Error analysis, Detection and tracking algorithms, Data processing, Wavefronts, Scanning probe microscopy, Chlorine, Phase interferometry

Proceedings Article | 5 February 1993 Paper
Proceedings Volume 1755, (1993) https://doi.org/10.1117/12.140770
KEYWORDS: Sensors, Phase shifts, Error analysis, Scanning probe microscopy, Fourier transforms, Interferometry, Phase measurement, Fringe analysis, Chlorine, Calcium

Proceedings Article | 1 October 1991 Paper
Proceedings Volume 1508, (1991) https://doi.org/10.1117/12.47089
KEYWORDS: Fringe analysis, Phase shifting, Phase shifts, Fourier transforms, Error analysis, Deflectometry, Holography, Speckle, Digital filtering, Wavefront sensors

Proceedings Article | 1 August 1991 Paper
Joanna Schmit, Tadeusz Piatkowski
Proceedings Volume 1391, (1991) https://doi.org/10.1117/12.57157
KEYWORDS: Ferroelectric materials, Interferometry, Fizeau interferometers, Mirrors, Fourier transforms, Phase measurement, Sagnac interferometers, Calibration, Fringe analysis, Laser applications

Showing 5 of 30 publications
Proceedings Volume Editor (7)

SPIE Conference Volume | 18 July 2014

SPIE Conference Volume | 16 July 2012

SPIE Conference Volume | 2 August 2010

SPIE Conference Volume | 10 August 2008

SPIE Conference Volume | 13 August 2006

SPIE Conference Volume | 2 August 2004

SPIE Conference Volume | 20 June 2002

Showing 5 of 7 publications
Conference Committee Involvement (28)
Interferometry and Structured Light 2024
21 August 2024 | San Diego, California, United States
Interferometry XXI
24 August 2022 | San Diego, California, United States
Interferometry XX
24 August 2020 | Online Only, California, United States
Interferometry XIX
21 August 2018 | San Diego, California, United States
Optical Manufacturing and Testing XII
20 August 2018 | San Diego, California, United States
Interferometry XVIII
30 August 2016 | San Diego, California, United States
Optical Manufacturing and Testing XI
9 August 2015 | San Diego, California, United States
Interferometry XVII: Techniques and Analysis
17 August 2014 | San Diego, California, United States
Optical Manufacturing and Testing X
26 August 2013 | San Diego, California, United States
Interferometry XVI: Techniques and Analysis
13 August 2012 | San Diego, California, United States
Optical Fabrication, Testing, and Metrology IV
7 September 2011 | Marseille, France
Optical Manufacturing and Testing IX
22 August 2011 | San Diego, California, United States
Interferometry XV: Techniques and Analysis
2 August 2010 | San Diego, California, United States
Optical Manufacturing and Testing VIII
4 August 2009 | San Diego, California, United States
Optical Fabrication, Testing, and Metrology III
2 September 2008 | Glasgow, Scotland, United Kingdom
Interferometry XIV: Techniques and Analysis
11 August 2008 | San Diego, California, United States
Optical Manufacturing and Testing VII
28 August 2007 | San Diego, California, United States
Interferometry XIII: Applications
16 August 2006 | San Diego, California, United States
Interferometry XIII: Techniques and Analysis
14 August 2006 | San Diego, California, United States
Optical Fabrication, Testing, and Metrology II
13 September 2005 | Jena, Germany
Lasers and Applications
30 August 2005 | Warsaw, Poland
Optical Manufacturing and Testing VI
31 July 2005 | San Diego, California, United States
Interferometry XII: Applications
4 August 2004 | Denver, Colorado, United States
Interferometry XII: Techniques and Analysis
2 August 2004 | Denver, Colorado, United States
Optical Manufacturing and Testing V
3 August 2003 | San Diego, California, United States
Interferometry XI: Techniques and Analysis
8 July 2002 | Seattle, WA, United States
Precision Optical Measurements
18 September 2001 | Tucson, AZ, United States
Laser Interferometry X: Techniques and Analysis
31 July 2000 | San Diego, CA, United States
Showing 5 of 28 Conference Committees
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