Jonathan M. Stamp
Sr. Principal Processing Engineer at Medtronic Inc
SPIE Involvement:
Author
Area of Expertise:
PhotoLithography , MEMS
Publications (1)

Proceedings Article | 1 June 1992 Paper
Mark Perkins, Jonathan Stamp
Proceedings Volume 1674, (1992) https://doi.org/10.1117/12.130352
KEYWORDS: Reticles, Optical lithography, Semiconducting wafers, Distortion, Lithography, Optical alignment, Visualization, Wafer-level optics, Metals, Image registration

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