We present progress towards demonstrating multi-passed stimulated Raman scattering microscopy and multi-passed transmission electron microscopy. A multi-pass microscope interrogates a sample multiple times in a cyclical and deterministic fashion. This can lead to a metrological advantage for imaging weak scatterers. The enhanced sensitivity can yield a significant reduction in damage imparted to biological samples or can reduce image acquisition time. The approach compares favorably with imaging techniques using squeezed or entangled probe states, but avoids the technical complexity associated with the production of such states.
KEYWORDS: Transmission electron microscopy, Prisms, Pulsed laser operation, Monochromators, Microscopy, Magnetism, Laser energy, Electron microscopy, Electron microscopes, Control systems
Multi-pass optical and electron microscopes outperform standard single-pass instruments in dose-limited regimes and have been shown to be quantum optimal. We report on recent progress towards demonstrating multi-pass transmission electron microscopy with a focus on the electron gun and monochromator system. Prompt electron emission from a Schottky emitter is laser-triggered with nanosecond optical pulses, and a single-photon emission process can be used to generate high current pulses with narrow intrinsic energy spreads. These pulse properties could be useful for nanosecond time-resolved and potentially single-shot microscopy experiments and are well-suited for use in a multi-pass transmission electron microscope.
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