Dr. Kai Tiedtke
at Deutsches Elektronen-Synchrotron
SPIE Involvement:
Editor | Author
Publications (22)

Proceedings Article | 9 June 2023 Presentation
Markus Ilchen, Sadia Bari, Thomas Baumann, Christopher Behrens, Yilmaz Bican, Mahdi Bidhendi, Rebecca Boll, Markus Braune, Günter Brenner, Francesca Callegari, Alberto De Fanis, Markus Degenhardt, Kristina Dingel, Stefan Düsterer, Felix Egun, Arno Ehresmann, Benjamin Erk, Lars Funke, Andreas Galler, Gianluca Geloni, Gesa Götzke, Tais Gorkhover, Jan Grünert, Patrik Grychtol, Marc Guetg, Andreas Hans, Arne Held, Ruda Hindrikson, Moritz Hoesch, Till Jahnke, Fini Jastrow, Reinhard Kienberger, Joakim Laksman, Mats Larsson, Jia Liu, Jon Marangos, Lutz Marder, David Meier, Michael Meyer, Najmeh Mirian, Jacobo Montano, Terence Mullins, Valerija Music, Christian Ott, Thorsten Otto, Yevheniy Ovcharenko, Steffen Palutke, Christopher Passow, Thomas Pfeifer, Nils Rennhack, Daniel Rivas, Daniel Rolles, Artem Rudenko, Patrick Rupprecht, Sara Savio, Albert Schletter, Frank Scholz, Jörn Seltmann, Svitozar Serkez, Philipp Schmidt, Evgeny Schneidmiller, Bernhard Sick, Richard Thomas, Sergey Usenko, Jens Viefhaus, Peter Walter, Vincent Wanie, Niclas Wieland, Lasse Wülfing, Mikhail Yurkov, Vitali Zhaunerchyk, Kai Tiedtke, Wolfram Helml
Proceedings Volume PC12581, PC1258108 (2023) https://doi.org/10.1117/12.2669164
KEYWORDS: Diagnostics, X-rays, X-ray technology, Structural dynamics, Photonics, Nonlinear dynamics, Liquid crystal lasers

Proceedings Article | 18 April 2021 Presentation
Philip Heimann, Stefan Moeller, Matthew Seaberg, Peter Walter, William Schlotter, David Fritz, Andrey Sorokin, Fini Jastrow, Kai Tiedtke, Takahiro Tanaka
Proceedings Volume 11776, 117760P (2021) https://doi.org/10.1117/12.2589188

Proceedings Article | 14 May 2019 Presentation
Tomáš Burian, Vera Hájková, Libor Juha, Karel Saksl, Vojtech Vozda, Igor Makhotkin, Eric Louis, Siegfried Schreiber, Kai Tiedtke, Sven Toleikis, Barbara Keitel, Elke Plönjes, Mabel Ruiz-Lopez, Marion Kuhlmann, Thomas Wodzinski, Hartmut Enkisch, Martin Hermann, Sebastian Strobel, Rolf Loch, Ryszard Sobierajski, Iwanna Jacyna, Dorota Klinger, Marek Jurek, Jerzy Pelka, Gosse de Vries, Michael Störmer, Frank Scholze, Frank Siewert, Tobias Mey, Jaromír Chalupský
Proceedings Volume 11035, 110350P (2019) https://doi.org/10.1117/12.2524718
KEYWORDS: X-rays, Optical filters, X-ray lasers, Free electron lasers, Laser ablation, Aluminum, Silicon, Signal attenuation, Extreme ultraviolet, Metals

Proceedings Article | 24 April 2019 Paper
Sanghoon Song, Roberto Alonso-Mori, Matthieu Chollet, Yiping Feng, James Glownia, Henrik Lemke, Marcin Sikorski, Diling Zhu, Stefan Moeller, Hae Ja Lee, Mark Hunter, Gabriella Carini, Kai Tiedtke, Ulf Jastrow, Andrey Sorokin, Mathias Richter, Shigeki Owada, Kensuke Tono, Norio Saito, Takahiro Tanaka, Masahiro Kato, Makina Yabashi, Aymeric Robert
Proceedings Volume 11038, 1103810 (2019) https://doi.org/10.1117/12.2520827
KEYWORDS: X-rays, Power meters, Hard x-rays, X-ray detectors, Diagnostics, Free electron lasers

Showing 5 of 22 publications
Proceedings Volume Editor (4)

Conference Committee Involvement (9)
X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VII
7 April 2025 | Prague, Czech Republic
X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI
27 April 2023 | Prague, Czech Republic
EUV and X-ray Optics, Sources, and Instrumentation
19 April 2021 | Online Only, Czech Republic
X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation
4 April 2019 | Prague, Czech Republic
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
18 August 2014 | San Diego, California, United States
Showing 5 of 9 Conference Committees
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