Prof. Kees J. Weijer
at Univ of Dundee
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 August 2017 Paper
Sascha Reidt, Ricardo B. Correia, Mark Donnachie, Cornelis Weijer, Michael MacDonald
Proceedings Volume 10347, 1034709 (2017) https://doi.org/10.1117/12.2277324
KEYWORDS: Microscopy, Bessel beams, Statistical analysis, Biology, Image quality, Quantitative analysis, Laser scattering, Scattering, Light scattering, Beam shaping

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