Leily Zafari
at ENSERG
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 June 2007 Paper
Proceedings Volume 6600, 66000J (2007) https://doi.org/10.1117/12.724671
KEYWORDS: Interfaces, Oxides, Silicon, Doping, Field effect transistors, Dielectrics, Instrument modeling, Silicon carbide, Signal to noise ratio, Transistors

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