Dr. Masashi Ishikawa
at Tokushima University
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 June 2024 Poster + Paper
Proceedings Volume 13047, 1304717 (2024) https://doi.org/10.1117/12.3013386
KEYWORDS: Inspection, Thermography, Signal to noise ratio, Defect detection, Nondestructive evaluation, Signal processing, Infrared radiation

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